Concept
The trend towards miniaturization and increased performance of electronic components and assemblies is still unbroken. In order to save space, but also to avoid disturbances on high speed buses, test pads on the application are reduced as much as possible.
As a result, classic in-circuit test approaches are in some cases already unable to achieve sufficient test coverage because access to test points is lacking. This is where ProMik's latest SMART ICT technology comes into play. Here we use our microcontroller know-how to execute test functions directly on the application. Thus required test points are limited to the central microcontroller/SoC. In the future, you will benefit from high-speed transfer rates not only during programming, but also during testing. Even with boundary scan test scopes, SMART ICT helps you save cycle times. Enormous saving potentials result, among other things, with regard to test coverage, equipment and development.
