Innovation SMART ICT

ProMik Testing -
reduce test points, 
increase test coverage,
& execute functional tests 

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ProMik SMART ICT Benefits

Costs saving potential

Ideally suited for applications with reduced test pads access

  • Using target device flash interface
  • Parallel access on panel level 
  • e.g. camera applications, key applications, sensors

Dynamic control 
of generic library

  • Test engineer has full control over test routines, allowing dynamic test coverage
  • Flexible use for various applications
  • Configurable I/O lines, interface channels & routines, analogue functions, etc.



The trend towards miniaturization and increased performance of electronic components and
assemblies is still unbroken. In order to save space, but also to avoid disturbances on high speed
buses, test pads on the application are reduced as much as possible.

As a result, classic in-circuit test approaches are in some cases already unable to achieve sufficient test coverage
because access to test points is lacking. This is where ProMik's latest SMART ICT technology comes into play.
Here we use our microcontroller know-how to execute test functions directly on the application. Thus required test points
are limited to the central microcontroller/SoC. In the future, you will benefit from high-speed transfer rates not only during
programming, but also during testing. Even with boundary scan test scopes, SMART ICT  helps you save cycle times.
Enormous saving potentials result, among other things, with regard to test coverage, equipment and development.



Toolbox Overview


SMART ICT Toolbox: ProMik innovations for unlimited opportunities 

SMART ICT sets new standards in electronics production and can certainly be described as a revolution
in the testing of electronic assemblies.

We are continuously developing our solutions. We recognize potentials at an early stage thanks to our customer proximity.
Resulting in a growing portfolio of innovative technologies and solutions. Through modular SMART ICT software updates
ProMik`s Multi Standard Programmer is extended by numerous On-Board test functions.

In line with current requirements, we offer you a broad portfolio of innovative SMART ICT modules.
These enable complex voltage sequences, precise current measurements in the µA range and fieldbus testing.

convincing efficiency

Our Use Cases

Experience pure innovation with SMART ICT.
Many of our customers already benefit from cost savings and optimized processes.

Get in touch with us and find out more to already realized projects.