25 years of experience in the field of flash programming, brings us in the position to identify and develop innovative technologies. Hence, we are excited to announce that we successfully implemented SMART ICT test function into all available Infineon Aurix devices. With our special knowledge about the AURIX architecture and with our robust software we can flash the devices with long cables in high speed at the physical limits of the silicon device.
Besides, our new device driver will allow you to execute special functions which will give to ability to test devices without test pad access as well as to perform dedicated functional tests. Furthermore, we are proud to announce that with ProMik’s SMART ICT technology you will cover all Boundary Scan functions at highest JTAG frequency with distances up to 1,5m from target to programmer.