Innovative DDR4 RAM testing
ProMik's unique technology SMART ICT realises new possibilities in the field of testing!
With SMART ICT, for example, RAM memories can be fully tested in the shortest possible time using the most efficient bootloader technologies. With the help of the processor's memory controller, tests can be implemented with nominal clock and timing, whereby errors dependent on the operating clock can be detected at an early stage, thus additionally reducing the test time. Bad solder joints, manufacturing defects on the PCB as well as defective components for signal filtering can thus be reliably identified. Error analysis and benchmarking of the test data can also be carried out directly in the processor, so that only the results need to be transmitted directly to the Flash/test station.