Testing with few or no test points

SMART ICT

Classic tests reach their limits due to the lack of test points - SMART ICT from ProMik solves this problem.
Test functions run directly on the application, with minimal test effort on the microcontroller/SoC.
High-speed transfer rates accelerate programming and testing, even with boundary-scan.
The result: maximum efficiency, reduced costs.

Most cost-effective innovation in test procedures

Parallel resources for testing at panel level
Current measurement (from 1uA to 1A)
Execution of test functions on MCU of the application, using a ProMik bootloader
Inrush current control
Voltage measurements
Test of fieldbus communication BroadR-Reach, CAN FD, Single Wire CAN, FlexRay, LI

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